SAMPLE=ACMPCOUNT, EXMODE=DISABLE, SETIF=NONE
Scan Configuration
| THRES | ACMP Threshold or VDAC Data |
| SAMPLE | Select Sample Mode 0 (ACMPCOUNT): Counter output will be used in evaluation 1 (ACMP): ACMP output will be used in evaluation 2 (ADC): ADC output will be used in evaluation 3 (ADCDIFF): Differential ADC output will be used in evaluation |
| SETIF | Enable Interrupt Generation 0 (NONE): No interrupt is generated 1 (LEVEL): Set interrupt flag if the sensor triggers. 2 (POSEDGE): Set interrupt flag on positive edge of the sensor state 3 (NEGEDGE): Set interrupt flag on negative edge of the sensor state 4 (BOTHEDGES): Set interrupt flag on both edges of the sensor state |
| EXMODE | Set GPIO Mode 0 (DISABLE): Disabled 1 (HIGH): Push Pull, GPIO is driven high 2 (LOW): Push Pull, GPIO is driven low 3 (DACOUT): VDAC output |
| EXCLK | Select Clock Used for Excitation Timing |
| SAMPLECLK | Select Clock Used for Timing of Sample Delay |
| ALTEX | Use Alternative Excite Pin |